Texas Instruments - Highest resolution resistive sensing conditioner offers performance without compromise (PGA900) | Heisener Electronics
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Texas Instruments - Highest resolution resistive sensing conditioner offers performance without compromise (PGA900)

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Post-datum: 2015-09-23
PGA900 is the latest product from Texas Instruments. It is the industry's highest resolution resistive sensor signal conditioner. It can perform fast and accurate 24-bit measurements on conditions such as pressure, strain, flow or liquid level. The PGA900 signal conditioner provides a programmable core that provides flexible linearization and temperature compensation for many resistive bridge sensing applications. The PGA900 integrates two low-noise 24-bit analog-to-digital converters (ADCs) for high-resolution signal acquisition, and a 14-bit digital-to-analog converters (DACs) to provide highly linear analog outputs and multiple output interfaces, including analog Voltage, 4-20mA current loop, SPI, I2C, UART and single wire interface (OWI) provide designers with options to meet different application needs. The PGA900's integrated power management accepts external supply voltages from 3.3V to 30V. Key Features: 1-Fast, accurate sensor signal and temperature compensation: Two 24-bit ADCs are integrated to provide high-resolution signal acquisition. The low drift reference voltage has a maximum value of 10 ppm / ° C, enabling high accuracy over an operating temperature range of -40 ° C to 150 ° C. 2-Integrated 14-bit DAC: Enables highly linear analog output. 3-User-programmable temperature and nonlinear compensation algorithms: The integrated ARM® Cortex®-M0 core enables developers to use proprietary temperature and nonlinear compensation algorithms to distinguish the final product. 4-Simple Calibration: The single wire interface allows communication, configuration and calibration via the power pins without the need for additional wiring. 5-Wide input voltage allows direct connection to the power supply: The PGA900 evaluation module (EVM) enables designers to quickly and easily evaluate the performance and integrated functions of the device.